{"title":"制造数据:利用组件到系统的分析实现价值最大化","authors":"M. Kamm","doi":"10.1109/TEST.2009.5355834","DOIUrl":null,"url":null,"abstract":"This poster will provide a high-level description of Cisco's manufacturing process including how, where and in what form data is collected at various test steps. Trade offs are described to optimize test time and diagnostics for any failing parts in order to provide actionable data for failure analysis. The principal goal of the poster is to raise awareness regarding base component requirements for embedded instrumentation to allow for optimal diagnostic results and speed. Also how synchronized data sharing with stake holders can optimize closed loop corrective action, resources and quality.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Manufacturing data: Maximizing value using component-to-system analysis\",\"authors\":\"M. Kamm\",\"doi\":\"10.1109/TEST.2009.5355834\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This poster will provide a high-level description of Cisco's manufacturing process including how, where and in what form data is collected at various test steps. Trade offs are described to optimize test time and diagnostics for any failing parts in order to provide actionable data for failure analysis. The principal goal of the poster is to raise awareness regarding base component requirements for embedded instrumentation to allow for optimal diagnostic results and speed. Also how synchronized data sharing with stake holders can optimize closed loop corrective action, resources and quality.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355834\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355834","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Manufacturing data: Maximizing value using component-to-system analysis
This poster will provide a high-level description of Cisco's manufacturing process including how, where and in what form data is collected at various test steps. Trade offs are described to optimize test time and diagnostics for any failing parts in order to provide actionable data for failure analysis. The principal goal of the poster is to raise awareness regarding base component requirements for embedded instrumentation to allow for optimal diagnostic results and speed. Also how synchronized data sharing with stake holders can optimize closed loop corrective action, resources and quality.
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