{"title":"高速集成逻辑电路中互连线路的邻近效应","authors":"J. Chilo, G. Angénieux, C. Monllor","doi":"10.1109/EUMA.1983.333255","DOIUrl":null,"url":null,"abstract":"The proximity and coupling effects between interconnection lines in V.S.L.I. circuits are studied by evaluating the power in the circuit. The coupling and propagation matrices and the exact current distribution in the conductors are established. The results of computation show that the losses and the dispersions in the lines are increased by proximity effects.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Proximity Effects of Interconnection Lines in High Speed Integrated Logic Circuits\",\"authors\":\"J. Chilo, G. Angénieux, C. Monllor\",\"doi\":\"10.1109/EUMA.1983.333255\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proximity and coupling effects between interconnection lines in V.S.L.I. circuits are studied by evaluating the power in the circuit. The coupling and propagation matrices and the exact current distribution in the conductors are established. The results of computation show that the losses and the dispersions in the lines are increased by proximity effects.\",\"PeriodicalId\":105436,\"journal\":{\"name\":\"1983 13th European Microwave Conference\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1983 13th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1983.333255\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333255","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Proximity Effects of Interconnection Lines in High Speed Integrated Logic Circuits
The proximity and coupling effects between interconnection lines in V.S.L.I. circuits are studied by evaluating the power in the circuit. The coupling and propagation matrices and the exact current distribution in the conductors are established. The results of computation show that the losses and the dispersions in the lines are increased by proximity effects.
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