Martin Kleindienst, Stefan Koch, M. Reichhartinger
{"title":"基于模型的高效硅片连续流加热器温度控制","authors":"Martin Kleindienst, Stefan Koch, M. Reichhartinger","doi":"10.1109/CCTA41146.2020.9206290","DOIUrl":null,"url":null,"abstract":"This paper proposes a model-based control approach for a liquid flow heater operated within silicon wafer processing tools used in the semiconductor industry. A distributed-parameter model is presented to describe the thermal dynamic behavior of the heater. Adopting the early-lumping approach, an observer-based controller is designed. This controller ensures a vanishing steady-state error in the case of constant input signals and disturbances. The implemented feedback loop relies on an observer-based anti-windup technique. Real-world tests demonstrate the effectiveness and feasibility of the proposed approach.","PeriodicalId":241335,"journal":{"name":"2020 IEEE Conference on Control Technology and Applications (CCTA)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Model-based Temperature Control of a Continuous Flow Heater for Efficient Processing of Silicon Wafers\",\"authors\":\"Martin Kleindienst, Stefan Koch, M. Reichhartinger\",\"doi\":\"10.1109/CCTA41146.2020.9206290\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a model-based control approach for a liquid flow heater operated within silicon wafer processing tools used in the semiconductor industry. A distributed-parameter model is presented to describe the thermal dynamic behavior of the heater. Adopting the early-lumping approach, an observer-based controller is designed. This controller ensures a vanishing steady-state error in the case of constant input signals and disturbances. The implemented feedback loop relies on an observer-based anti-windup technique. Real-world tests demonstrate the effectiveness and feasibility of the proposed approach.\",\"PeriodicalId\":241335,\"journal\":{\"name\":\"2020 IEEE Conference on Control Technology and Applications (CCTA)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Conference on Control Technology and Applications (CCTA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCTA41146.2020.9206290\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Conference on Control Technology and Applications (CCTA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCTA41146.2020.9206290","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Model-based Temperature Control of a Continuous Flow Heater for Efficient Processing of Silicon Wafers
This paper proposes a model-based control approach for a liquid flow heater operated within silicon wafer processing tools used in the semiconductor industry. A distributed-parameter model is presented to describe the thermal dynamic behavior of the heater. Adopting the early-lumping approach, an observer-based controller is designed. This controller ensures a vanishing steady-state error in the case of constant input signals and disturbances. The implemented feedback loop relies on an observer-based anti-windup technique. Real-world tests demonstrate the effectiveness and feasibility of the proposed approach.