硫系玻璃半导体中的电流成丝和开关效应研究进展

N. Sovtus, K. Mynbaev
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摘要

本文综述了硫系玻璃半导体的电流成丝和开关效应,介绍了其在相变存储器件中的应用前景。首先,回顾了CGSs及其性质的研究历史。其次,讨论了电流灯丝在CGSs中的形成,并分析了材料中热量释放的规模以及灯丝的几何形状。最后,本文回顾了解释CGSs转换效应的各种假设。结果表明,CGS中开关效应最相关的模型是所谓的“负u中心”的多声子隧穿电离模型。这个模型是基于这样一个假设,即在某个时间点,雪崩般的电流增加与原子上的电子的质量隧穿有关,这是由于原子的热振动造成的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Current Filamentation and Switching Effect in Chalcogenide Glassy Semiconductors: A Review
A review on current filamentation and switching effect in chalcogenide glassy semiconductors (CGSs), which are promising materials for the development of phase change memory devices, is presented. First, a history of the research on CGSs and their properties is considered. Next, formation of a current filament in CGSs is discussed and the scale of heat release in the material as well as the geometric shape of the filament is analyzed. Finally, various hypotheses developed for the explanation of the switching effect in CGSs are reviewed. It is shown that the most relevant model of the switching effect in CGS is the model of multi-phonon tunneling ionization of the so-called ‘negative-U centers’. This model is based on the assumption that an avalanche-like increase in current at a certain point in time is associated with mass tunneling of electrons located on atoms, occuring due to thermal vibrations of atoms.
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