BTI老化对电荷泵电路的影响

2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST) Pub Date : 2022-06-08 DOI:10.1109/mocast54814.2022.9837768

Spyridon Spyridonos, Y. Tsiatouhas

{"title":"BTI老化对电荷泵电路的影响","authors":"Spyridon Spyridonos, Y. Tsiatouhas","doi":"10.1109/mocast54814.2022.9837768","DOIUrl":null,"url":null,"abstract":"Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.","PeriodicalId":122414,"journal":{"name":"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)","volume":"382 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"BTI Aging Influence on Charge Pump Circuits\",\"authors\":\"Spyridon Spyridonos, Y. Tsiatouhas\",\"doi\":\"10.1109/mocast54814.2022.9837768\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.\",\"PeriodicalId\":122414,\"journal\":{\"name\":\"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)\",\"volume\":\"382 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/mocast54814.2022.9837768\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mocast54814.2022.9837768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

电荷泵广泛应用于现代纳米技术电路中。由于在这些电路的内部节点产生的高电压水平，偏置温度不稳定性(BTI)现象对其老化的影响预计是实质性的。本文研究了各种电荷泵电路的BTI相关老化问题，并进行了老化仿真比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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BTI Aging Influence on Charge Pump Circuits

Charge pumps are widely used in modern nanometer technology circuits. Due to the high voltage levels that are generated in the internal nodes of these circuits, the influence of bias temperature instability (BTI) phenomena on their aging is expected to be substantial. In this paper we study the BTI related aging of various charge pump circuits and aging related simulation comparisons are presented.

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2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)

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