连接器接触边界寄生电感对电磁辐射影响的研究

Yu-ichi Hayashi, K. Matsuda, T. Mizuki, H. Sone
{"title":"连接器接触边界寄生电感对电磁辐射影响的研究","authors":"Yu-ichi Hayashi, K. Matsuda, T. Mizuki, H. Sone","doi":"10.1109/APEMC.2012.6237952","DOIUrl":null,"url":null,"abstract":"A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation\",\"authors\":\"Yu-ichi Hayashi, K. Matsuda, T. Mizuki, H. Sone\",\"doi\":\"10.1109/APEMC.2012.6237952\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.\",\"PeriodicalId\":300639,\"journal\":{\"name\":\"2012 Asia-Pacific Symposium on Electromagnetic Compatibility\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Asia-Pacific Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2012.6237952\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2012.6237952","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

当电气设备在高频频段工作时,连接器松动会导致电磁辐射增加。为了研究由于连接器中松动接触而产生电磁辐射的机制,我们估计了松动连接器接触边界处的高频电路元件。在此基础上,通过实验证明了高频电路元件与电子器件电磁辐射的关系。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation on the effect of parasitic inductance at connector contact boundary on electromagnetic radiation
A loosened connector causes an increase in electromagnetic radiation when electric devices operate in high-frequency bands. To investigate the mechanisms generating electromagnetic radiation due to a loose contact in a connector, we estimate high-frequency circuit elements at the contact boundary of a loosened connector. On the basis of this estimation, we show the relationship between high-frequency circuit elements and the electromagnetic radiation from electric devices through experiments.
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