具有三维终端和终端边缘分量的基于场的寄生电容模型

Aixi Zhang, Wei Zhao, Yue Hu, Jin He, Qingxing He, Lei Song, Haiqin Zhou, Yong Wu
{"title":"具有三维终端和终端边缘分量的基于场的寄生电容模型","authors":"Aixi Zhang, Wei Zhao, Yue Hu, Jin He, Qingxing He, Lei Song, Haiqin Zhou, Yong Wu","doi":"10.1109/ACQED.2015.7274028","DOIUrl":null,"url":null,"abstract":"In this paper, a parasitic capacitance model for a single three-dimensional (3-D) wire above a plate is developed. The model decomposes electric field into various regions and gives solutions to each part. The total capacitance is the summation of all capacitance parts corresponding to the electric field distribution. The model's physical base minimizes its complexity and error comparing to a traditional empirical fitting process. Verified by extensive COMSOL simulations, the model can accurately predict parasitic capacitance for a wide range of BEOL wire dimensions. Thus, it holds potential to be further investigated for circuit simulation and design.","PeriodicalId":376857,"journal":{"name":"2015 6th Asia Symposium on Quality Electronic Design (ASQED)","volume":"272 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A field-based parasitic capacitance model with 3-D terminal and terminal fringe components\",\"authors\":\"Aixi Zhang, Wei Zhao, Yue Hu, Jin He, Qingxing He, Lei Song, Haiqin Zhou, Yong Wu\",\"doi\":\"10.1109/ACQED.2015.7274028\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a parasitic capacitance model for a single three-dimensional (3-D) wire above a plate is developed. The model decomposes electric field into various regions and gives solutions to each part. The total capacitance is the summation of all capacitance parts corresponding to the electric field distribution. The model's physical base minimizes its complexity and error comparing to a traditional empirical fitting process. Verified by extensive COMSOL simulations, the model can accurately predict parasitic capacitance for a wide range of BEOL wire dimensions. Thus, it holds potential to be further investigated for circuit simulation and design.\",\"PeriodicalId\":376857,\"journal\":{\"name\":\"2015 6th Asia Symposium on Quality Electronic Design (ASQED)\",\"volume\":\"272 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 6th Asia Symposium on Quality Electronic Design (ASQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ACQED.2015.7274028\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 6th Asia Symposium on Quality Electronic Design (ASQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACQED.2015.7274028","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

本文建立了板上单根三维导线的寄生电容模型。该模型将电场分解成不同的区域,并给出每个区域的解。总电容是与电场分布相对应的所有电容部分的总和。与传统的经验拟合过程相比,该模型的物理基础将其复杂性和误差降至最低。通过广泛的COMSOL仿真验证,该模型可以准确预测各种BEOL线尺寸的寄生电容。因此,它具有进一步研究电路仿真和设计的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A field-based parasitic capacitance model with 3-D terminal and terminal fringe components
In this paper, a parasitic capacitance model for a single three-dimensional (3-D) wire above a plate is developed. The model decomposes electric field into various regions and gives solutions to each part. The total capacitance is the summation of all capacitance parts corresponding to the electric field distribution. The model's physical base minimizes its complexity and error comparing to a traditional empirical fitting process. Verified by extensive COMSOL simulations, the model can accurately predict parasitic capacitance for a wide range of BEOL wire dimensions. Thus, it holds potential to be further investigated for circuit simulation and design.
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