B. Sangchoolie, Fatemeh Ayatolahi, R. Johansson, J. Karlsson
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引用次数: 10
摘要
ISA级故障注入,即在指令集体系结构(Instruction Set Architecture, ISA)寄存器和主存字中注入位翻转故障,被广泛用于研究计算机系统中瞬态和间歇性硬件故障的影响。本文比较了isa级故障注入的两种技术:读时注入和写时注入。第一种技术在数据项(寄存器或内存字的内容)被机器指令读取之前注入位翻转,而第二种技术在数据项被机器指令更新之后注入位翻转。此外,本文还比较了读时注入的两种变体,其中一种是赋予所有错误相同的权重,另一种是使用权重因子来反映数据项在寄存器或存储字中花费的时间。加权的读时注入旨在准确地模拟当电离粒子扰动驻留在ISA寄存器或存储字中的数据项时发生的软错误。这与写时注入相反,后者模拟传播到ISA寄存器或内存字中的错误。我们的实验表明,这三种技术得到的结果有显著差异。
A Comparison of Inject-on-Read and Inject-on-Write in ISA-Level Fault Injection
ISA-level fault injection, i.e. the injection of bit-flip faults in Instruction Set Architecture (ISA) registers and main memory words, is widely used for studying the impact of transient and intermittent hardware faults in computer systems. This paper compares two techniques for ISA-level fault injection: inject-on-read, and inject-on-write. The first technique injects bit-flips in a data-item (the content of a register or memory word) just before the data-item is read by a machine instruction, while the second one injects bit-flips in a data-item just after it has been updated by a machine instruction. In addition, the paper compares two variants of inject-on-read, one where all faults are given the same weight and one where weight factors are used to reflect the time a data-item spends in a register or memory word. The weighted injected-on-read aims to accurately model soft errors that occur when an ionizing particle perturbs a data-item while it resides in an ISA register or a memory word. This is in contrast to inject-on-write, which emulates errors that propagate into an ISA register or a memory word. Our experiments show significant differences in the results obtained with the three techniques.