5G新无线电毫米波相控阵测试

M. Foegelle
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引用次数: 0

摘要

随着无线行业继续向5G迈进,基站和用户设备的毫米波无线电的开发和后续测试仍然面临许多障碍。通过天线阵列在这些频率上测试大多数一致性和性能指标的需求带来了重大挑战,并导致过大的测量不确定性估计,以至于结果指标本身可能毫无用处。造成这种测量不确定性的主要原因是所使用的OTA测试范围的影响,这促使业界转向昂贵的紧凑型距离反射器系统,以克服直接远场测量相关的路径损耗问题。然而,这种方法需要使用组合轴测量系统,这意味着需要相当大的支撑结构来保持被测设备并在两个正交轴上操作它。本文探讨了在毫米波器件测试中使用传统“射频透明”支撑材料所涉及的一些限制和注意事项。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testing mmWave Phased Arrays for the 5G New Radio
As the wireless industry continues the move to 5G, the development and subsequent testing of mmWave radios for both base stations and user equipment still face numerous hurdles. The need to test most conformance and performance metrics through the antenna array at these frequencies poses significant challenges and has resulted in excessively large measurement uncertainty estimates to the point where the resulting metrics themselves may be useless. A large contribution to this measurement uncertainty is the impact of the over-the-air (OTA) test range used, driving the industry towards expensive compact range reflector systems in order to overcome the path loss considerations associated with direct far-field measurements. However, this approach necessitates the use of a combined axis measurement system, which implies the need for considerable support structure to hold the device under test and manipulate it in two orthogonal axes. This paper explores some of the limitations and considerations involved in the use of traditional “RF transparent” support materials for mmWave device testing.
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