{"title":"电网终端对可靠性研究","authors":"Y. Park","doi":"10.1109/IEEM.2010.5674570","DOIUrl":null,"url":null,"abstract":"In this paper, we study the terminal-pair reliability in grid networks. An area switched tactical communication system such as ATN (Army Tactical Network) involve large number of nodes, and of links. The resulting huge number of possible combinations of node and link failures makes it difficult to perform quantitative analysis for system survivability assessments in terms of multi-hop connectivity, under jamming and physical attacks. We suggest an ATN Simulation Model (ATNSM) to overcome this difficulty for enumerating multi-hop routing successes to develop a lower bound on connectivity. The analysis techniques were exercised on an example ATN area coverage network model with 7×5 grid nodes under stress conditions.","PeriodicalId":285694,"journal":{"name":"2010 IEEE International Conference on Industrial Engineering and Engineering Management","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of the terminal-pair reliability in grid networks\",\"authors\":\"Y. Park\",\"doi\":\"10.1109/IEEM.2010.5674570\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we study the terminal-pair reliability in grid networks. An area switched tactical communication system such as ATN (Army Tactical Network) involve large number of nodes, and of links. The resulting huge number of possible combinations of node and link failures makes it difficult to perform quantitative analysis for system survivability assessments in terms of multi-hop connectivity, under jamming and physical attacks. We suggest an ATN Simulation Model (ATNSM) to overcome this difficulty for enumerating multi-hop routing successes to develop a lower bound on connectivity. The analysis techniques were exercised on an example ATN area coverage network model with 7×5 grid nodes under stress conditions.\",\"PeriodicalId\":285694,\"journal\":{\"name\":\"2010 IEEE International Conference on Industrial Engineering and Engineering Management\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Conference on Industrial Engineering and Engineering Management\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEEM.2010.5674570\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Industrial Engineering and Engineering Management","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEEM.2010.5674570","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of the terminal-pair reliability in grid networks
In this paper, we study the terminal-pair reliability in grid networks. An area switched tactical communication system such as ATN (Army Tactical Network) involve large number of nodes, and of links. The resulting huge number of possible combinations of node and link failures makes it difficult to perform quantitative analysis for system survivability assessments in terms of multi-hop connectivity, under jamming and physical attacks. We suggest an ATN Simulation Model (ATNSM) to overcome this difficulty for enumerating multi-hop routing successes to develop a lower bound on connectivity. The analysis techniques were exercised on an example ATN area coverage network model with 7×5 grid nodes under stress conditions.