使用智能夹层载体替换VXI系统中的遗留仪器

G.W. Guilbeaux, D. Clark, F. Harrison, W. Duff
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引用次数: 0

摘要

军事和商业自动化测试设备(ATE)用户正面临着重要的问题,即保持他们的ATE在他们被用来测试的产品的生命周期内可支持。此外,与复制和重新认证测试程序软件的成本相比,完全替换系统的成本通常是微不足道的。因此,越来越多的需求浮出水面,以重新使用现有测试程序软件的方式替换遗留设备。使用带有平台特定载波板的开放标准mezz卡的方法可以提供来自许多不同制造商的大量现代仪器选择,可以广泛重用传统设备和软件,并且可以清晰,轻松地迁移到现有和未来的平台。大多数常见的ATE仪器以夹层格式存在,并且可以为VXI、PXI、PCI和许多其他平台找到载波。载体可以是非智能的,允许主机软件直接访问夹层模块,也可以是智能的,允许板载固件进一步模拟传统仪器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Use of intelligent mezzanine carriers for legacy instrument replacement in VXI systems
Military and commercial automated test equipment (ATE) users are facing significant problems keeping their ATE supportable for the life cycle of the products they are being used to test. Further, the cost of completely replacing the system is often insignificant compared to the cost of replicating and re-certifying the test program software. As a result, requirements have increasingly surfaced to replace legacy equipment in such a manner as to re-use existing test program software. An approach using open standard mezzanine cards with platform specific carrier boards can provide an enormous selection of modern instruments from many different manufacturers, extensive reuse of legacy equipment and software, and a clear, easy migration path to existing and future platforms. Most common ATE instruments exist in a mezzanine format and carriers can be found for VXI, PXI, PCI, and many other platforms. Carriers can be non-intelligent allowing direct access to the mezzanine modules by the host software, or intelligent allowing on-board firmware to further emulate the legacy instrument.
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