基于h桥双面LCC谐振网络的SiC MOSFET、CoolMOS和Si MOSFET性能比较研究

Xiao-kun Li, Wen-jing Li, Biao Liang, G. Zhu, Ming Xie, Xiao-song Li
{"title":"基于h桥双面LCC谐振网络的SiC MOSFET、CoolMOS和Si MOSFET性能比较研究","authors":"Xiao-kun Li, Wen-jing Li, Biao Liang, G. Zhu, Ming Xie, Xiao-song Li","doi":"10.1109/ICIICII.2015.150","DOIUrl":null,"url":null,"abstract":"Silicon carbide (SiC) MOSFET is a new type of high voltage power switching device, featuring by low on-state resistance and fast switching speed. In recent years, it has received extensive research and application due to its prominent advantages of high temperature and high frequency, the comparisons and analysis of switching characteristic of SiC MOSFET and traditional silicon (Si) MOSFET is of great importance. In this paper, a test platform based on H-Bridge double-sided LCC ZVS resonant network is presented. The switching waveforms, switching time, turn-off voltage change rate (dv/dt), turn-on current change rate (di/dt), turn-off spike voltage, switching energy loss of SiC MOSFET, Si CoolMOS and Si MOSFET were compared and analyzed. Finally, the system efficiency and the temperature rise of the heat sink are compared using three kinds of MOSFET under the same output power and environment temperature. Experimental results show that SiC MOSFET switching time is the shortest and the turn-off voltage is small, the energy loss is the lowest under the same test environment.","PeriodicalId":349920,"journal":{"name":"2015 International Conference on Industrial Informatics - Computing Technology, Intelligent Technology, Industrial Information Integration","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Research on Performance Comparisons of SiC MOSFET, CoolMOS, and Si MOSFET Based on H-Bridge Double-Sided LCC Resonant Network\",\"authors\":\"Xiao-kun Li, Wen-jing Li, Biao Liang, G. Zhu, Ming Xie, Xiao-song Li\",\"doi\":\"10.1109/ICIICII.2015.150\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon carbide (SiC) MOSFET is a new type of high voltage power switching device, featuring by low on-state resistance and fast switching speed. In recent years, it has received extensive research and application due to its prominent advantages of high temperature and high frequency, the comparisons and analysis of switching characteristic of SiC MOSFET and traditional silicon (Si) MOSFET is of great importance. In this paper, a test platform based on H-Bridge double-sided LCC ZVS resonant network is presented. The switching waveforms, switching time, turn-off voltage change rate (dv/dt), turn-on current change rate (di/dt), turn-off spike voltage, switching energy loss of SiC MOSFET, Si CoolMOS and Si MOSFET were compared and analyzed. Finally, the system efficiency and the temperature rise of the heat sink are compared using three kinds of MOSFET under the same output power and environment temperature. Experimental results show that SiC MOSFET switching time is the shortest and the turn-off voltage is small, the energy loss is the lowest under the same test environment.\",\"PeriodicalId\":349920,\"journal\":{\"name\":\"2015 International Conference on Industrial Informatics - Computing Technology, Intelligent Technology, Industrial Information Integration\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 International Conference on Industrial Informatics - Computing Technology, Intelligent Technology, Industrial Information Integration\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIICII.2015.150\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 International Conference on Industrial Informatics - Computing Technology, Intelligent Technology, Industrial Information Integration","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIICII.2015.150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

碳化硅(SiC) MOSFET是一种新型高压功率开关器件,具有导通电阻低、开关速度快等特点。近年来,SiC MOSFET因其突出的高温、高频优势得到了广泛的研究和应用,比较分析其开关特性与传统硅(Si) MOSFET具有重要意义。本文介绍了一种基于h桥双面LCC ZVS谐振网络的测试平台。对比分析了SiC MOSFET、Si CoolMOS和Si MOSFET的开关波形、开关时间、关断电压变化率(dv/dt)、导通电流变化率(di/dt)、关断尖峰电压、开关能量损失。最后,比较了三种MOSFET在相同输出功率和环境温度下的系统效率和散热器温升。实验结果表明,在相同的测试环境下,SiC MOSFET的开关时间最短,关断电压小,能量损失最低。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research on Performance Comparisons of SiC MOSFET, CoolMOS, and Si MOSFET Based on H-Bridge Double-Sided LCC Resonant Network
Silicon carbide (SiC) MOSFET is a new type of high voltage power switching device, featuring by low on-state resistance and fast switching speed. In recent years, it has received extensive research and application due to its prominent advantages of high temperature and high frequency, the comparisons and analysis of switching characteristic of SiC MOSFET and traditional silicon (Si) MOSFET is of great importance. In this paper, a test platform based on H-Bridge double-sided LCC ZVS resonant network is presented. The switching waveforms, switching time, turn-off voltage change rate (dv/dt), turn-on current change rate (di/dt), turn-off spike voltage, switching energy loss of SiC MOSFET, Si CoolMOS and Si MOSFET were compared and analyzed. Finally, the system efficiency and the temperature rise of the heat sink are compared using three kinds of MOSFET under the same output power and environment temperature. Experimental results show that SiC MOSFET switching time is the shortest and the turn-off voltage is small, the energy loss is the lowest under the same test environment.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信