光电器件混合级仿真

M. Bahl, E. Heller, J. Ayubi-Moak, W. Ng, R. Scarmozzino, G. Letay, L. Schneider
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引用次数: 1

摘要

这里介绍了两个重要的设备,它们不能通过单一的模拟技术精确地和/或可跟踪地建模。给出了对每个设备进行寻址的仿真流程。第一种是图案发光二极管(LED),其光学建模需要结合FDTD(或RCWA)和光线追踪的混合级仿真方法。第二种是CMOS图像传感器(CIS),它需要工艺、光学和电气仿真技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mixed-level simulation of opto-electronic devices
Presented here are two important devices that cannot be modeled accurately and/or tractably by a single simulation technique. Simulation flows to address each device are presented. The first is a patterned Light Emitting Diode (LED), the optical modeling of which requires a mixed-level simulation approach combining FDTD (or RCWA) and Ray Tracing. The second is a CMOS Image Sensors (CIS), which requires process, optical and electrical simulation techniques.
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