{"title":"微波Ga-As集成电路的准单片方法","authors":"E. Bastida, G. Donzelli, G. Ghione, C. Naldi","doi":"10.1109/EUMA.1983.333253","DOIUrl":null,"url":null,"abstract":"A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A Quasi-Monolithic Approach to Microwave Ga-As Integrated Circuits\",\"authors\":\"E. Bastida, G. Donzelli, G. Ghione, C. Naldi\",\"doi\":\"10.1109/EUMA.1983.333253\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.\",\"PeriodicalId\":105436,\"journal\":{\"name\":\"1983 13th European Microwave Conference\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1983 13th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1983.333253\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Quasi-Monolithic Approach to Microwave Ga-As Integrated Circuits
A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.