微波Ga-As集成电路的准单片方法

E. Bastida, G. Donzelli, G. Ghione, C. Naldi
{"title":"微波Ga-As集成电路的准单片方法","authors":"E. Bastida, G. Donzelli, G. Ghione, C. Naldi","doi":"10.1109/EUMA.1983.333253","DOIUrl":null,"url":null,"abstract":"A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.","PeriodicalId":105436,"journal":{"name":"1983 13th European Microwave Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A Quasi-Monolithic Approach to Microwave Ga-As Integrated Circuits\",\"authors\":\"E. Bastida, G. Donzelli, G. Ghione, C. Naldi\",\"doi\":\"10.1109/EUMA.1983.333253\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.\",\"PeriodicalId\":105436,\"journal\":{\"name\":\"1983 13th European Microwave Conference\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1983-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1983 13th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1983.333253\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1983 13th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1983.333253","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

提出了一种新型的微波集成电路,它比混合电路和全单片电路都有明显的优势。然后报告了将倒装FET器件的S参数与全单片器件的S参数相关联的理论分析,这允许开发一种简单且非常有效的单片集成电路测试技术。最后介绍了新型电路和测试技术的实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Quasi-Monolithic Approach to Microwave Ga-As Integrated Circuits
A new class of microwave integrated circuits is presented, having definite advantages over both the hybrid and the fully monolithic solutions. A theoretical analysis correlating the S parameters of a flip-chip mounted FET device with those of a fully monolithic device is then reported, which permits to develop a straightforward and very efficient testing technique for monolithic ICs. Practical examples of the new circuits and of the testing technique are finally described.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信