SUN微系统物理科学中心VCSEL可靠性研究

Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004. Pub Date : 2004-06-28 DOI:10.1109/LEOSST.2004.1338703

D. Mcelfresh, L. Lopez, R. Melanson, D. Vacar

{"title":"SUN微系统物理科学中心VCSEL可靠性研究","authors":"D. Mcelfresh, L. Lopez, R. Melanson, D. Vacar","doi":"10.1109/LEOSST.2004.1338703","DOIUrl":null,"url":null,"abstract":"In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.","PeriodicalId":280347,"journal":{"name":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","volume":"105 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"VCSEL reliability studies at SUN microsystems physical sciences center\",\"authors\":\"D. Mcelfresh, L. Lopez, R. Melanson, D. Vacar\",\"doi\":\"10.1109/LEOSST.2004.1338703\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.\",\"PeriodicalId\":280347,\"journal\":{\"name\":\"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.\",\"volume\":\"105 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LEOSST.2004.1338703\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LEOSST.2004.1338703","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

在本文中，我们描述了实验并回顾了迄今为止的结果。退化的VCSEL阵列已经被审查，目前正在进行详细的物理表征。这一分析将使人们对VCSEL失效的表现、排放退化的机制和物理学有一个初步的了解。在不久的将来，计算系统的带宽需求将需要光互连。我们研究了产生最可靠的vcsel的具体参数-用于光互连的发射器引擎。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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VCSEL reliability studies at SUN microsystems physical sciences center

In this paper, we describe the experiment and review our results to date. Degraded VCSEL arrays have been censored and are currently being subjected to a detailed physical characterization. This analysis will provide a glimpse into the manifestation of VCSEL failures, the mechanisms and physics of emission degradation. Optical interconnects will be required for the bandwidth needs for computing systems in the near future. We have investigated the specific parameters that produce the most reliable VCSELs - the emitter engines for optical interconnects.

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来源期刊

Digest of the LEOS Summer Topical Meetings Biophotonics/Optical Interconnects and VLSI Photonics/WBM Microcavities, 2004.

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