在功率半导体器件参数自动提取中的形式化优化程序的使用

IEEE 34th Annual Conference on Power Electronics Specialist, 2003. PESC '03. Pub Date : 2003-06-15 DOI:10.1109/PESC.2003.1218163

A. Bryant, P. Palmer, J. Hudgins, E. Santi, X. Kang

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引用次数: 13

摘要

基于二极管、IGBT和相关电路的精确物理模型，概述了自动参数提取的过程。采用形式化优化方法对初始参数估计进行细化，并与硬件测试系统相结合，获得器件波形测量值。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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The use of a formal optimisation procedure in automatic parameter extraction of power semiconductor devices

A procedure for automatic parameter extraction is outlined, based on accurate physics-based models of the diode, IGBT and associated circuitry. A formal optimisation method is used to refine initial parameter estimates, and is coupled with a hardware testing system to obtain device waveform measurements.

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来源期刊

IEEE 34th Annual Conference on Power Electronics Specialist, 2003. PESC '03.

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