{"title":"一种无线基站产品可靠性提高试验方法","authors":"Yu Susheng, Deng Jie","doi":"10.1109/GSMM.2008.4534561","DOIUrl":null,"url":null,"abstract":"This paper has described the general process that reliability of wireless base station product is increased by using HALT test technique. For example, the HALT test process of wireless base station type A and its reliability enhancement is described.","PeriodicalId":304483,"journal":{"name":"2008 Global Symposium on Millimeter Waves","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Method for Reliability Increasing Test of Wireless Base Station Product\",\"authors\":\"Yu Susheng, Deng Jie\",\"doi\":\"10.1109/GSMM.2008.4534561\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper has described the general process that reliability of wireless base station product is increased by using HALT test technique. For example, the HALT test process of wireless base station type A and its reliability enhancement is described.\",\"PeriodicalId\":304483,\"journal\":{\"name\":\"2008 Global Symposium on Millimeter Waves\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-04-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 Global Symposium on Millimeter Waves\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GSMM.2008.4534561\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Global Symposium on Millimeter Waves","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GSMM.2008.4534561","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Method for Reliability Increasing Test of Wireless Base Station Product
This paper has described the general process that reliability of wireless base station product is increased by using HALT test technique. For example, the HALT test process of wireless base station type A and its reliability enhancement is described.