{"title":"利用快速电光泵浦-探针技术研究氮化镓基蓝色发光二极管的效率下降机制","authors":"J. Shi, Che-wei Lin, Wei Chen, M. L. Lee, J. Sheu","doi":"10.1109/PHO.2011.6110747","DOIUrl":null,"url":null,"abstract":"Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (~200A/cm2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"48 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique\",\"authors\":\"J. Shi, Che-wei Lin, Wei Chen, M. L. Lee, J. Sheu\",\"doi\":\"10.1109/PHO.2011.6110747\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (~200A/cm2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.\",\"PeriodicalId\":173679,\"journal\":{\"name\":\"IEEE Photonic Society 24th Annual Meeting\",\"volume\":\"48 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Photonic Society 24th Annual Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PHO.2011.6110747\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Photonic Society 24th Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHO.2011.6110747","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of the efficiency-droop mechanism in a GaN based blue light-emitting diodes using a very-fast electrical-optical pump-probe technique
Electrical-optical pump-probe is used to investigate GaN blue LEDs under different temperatures. Measurement result indicates that under moderate current density (~200A/cm2) piezoelectric field induced carrier-escaping cannot be neglected and is responsible for the observed efficiency-droop.