OPV材料中离子杂质的新测量方法

2019 26th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD) Pub Date : 2019-07-01 DOI:10.23919/AM-FPD.2019.8830562

Masaru Inoue, N. Oyabu, Yo Kumoda, Yu Suenaga, Tomoya Ishii, H. Naito

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引用次数: 2

摘要

我们演示了使用瞬态电流测量方法测量有机光伏(OPV)材料中离子杂质的浓度，该方法自1993年以来一直用于薄膜晶体管-液晶显示器的筛选和优化。我们推测离子杂质对OPV器件的效率和寿命有影响，并证实离子杂质浓度与OPV特性之间存在显著的相关性。

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Novel measurement method of ion impurity in OPV materials

We have demonstrated the measurement of the concentration of ion impurities in organic photovoltaic (OPV) materials by using a transient current measurement method that has been developed for the screening and the optimization of thin film transistor-liquid crystal displays since 1993. We speculate that ion impurity has impact on an efficiency and lifetime of OPV devices and confirm that there is a remarkable correlation between the concentration of ion impurity and the OPV characteristics.

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来源期刊

2019 26th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)

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