{"title":"用于验证ESD保护装置响应的TLP测量","authors":"H. Hyatt, J. Harris, A. Alanzo, P. Bellew","doi":"10.1109/6104.930959","DOIUrl":null,"url":null,"abstract":"Transmission line pulsers, commonly known as TLPs, have been used for many years to calibrate diagnostics, and provide precise high-voltage and high-current waveforms. The pulsers have been used to qualify the ESD response of many ESD protection circuits and devices (Rector and Hyatt, 1998; Gieser and Egger, 1996; Maloney and Khurana, 1985). TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), Transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors. This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The method differs from and is compared to time domain reflection (TDR) mode measurement techniques.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":"{\"title\":\"TLP measurements for verification of ESD protection device response\",\"authors\":\"H. Hyatt, J. Harris, A. Alanzo, P. Bellew\",\"doi\":\"10.1109/6104.930959\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transmission line pulsers, commonly known as TLPs, have been used for many years to calibrate diagnostics, and provide precise high-voltage and high-current waveforms. The pulsers have been used to qualify the ESD response of many ESD protection circuits and devices (Rector and Hyatt, 1998; Gieser and Egger, 1996; Maloney and Khurana, 1985). TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), Transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors. This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The method differs from and is compared to time domain reflection (TDR) mode measurement techniques.\",\"PeriodicalId\":332394,\"journal\":{\"name\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"37\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/6104.930959\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/6104.930959","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 37
摘要
传输线脉冲器,通常被称为tlp,多年来一直用于校准诊断,并提供精确的高压和大电流波形。脉冲器已被用于许多ESD保护电路和设备的ESD响应(Rector和Hyatt, 1998;Gieser and Egger, 1996;Maloney and Khurana, 1985)。除了估计器件级保护电路的ESD敏感性之外,TLP应用范围更广。TLPs已被用于认证许多ESD抑制器件,包括:器件级ESD保护电路,金属氧化物压敏电阻(MOV), Transorbs,复合电压可变材料(VVM),二极管,火花隙,偶尔甚至电容器和电阻。本文介绍了一种简化但通用的TLP电路和时域传输(TDT)模式测试方法。该方法不同于时域反射(TDR)模式测量技术,并与之进行了比较。
TLP measurements for verification of ESD protection device response
Transmission line pulsers, commonly known as TLPs, have been used for many years to calibrate diagnostics, and provide precise high-voltage and high-current waveforms. The pulsers have been used to qualify the ESD response of many ESD protection circuits and devices (Rector and Hyatt, 1998; Gieser and Egger, 1996; Maloney and Khurana, 1985). TLP applications cover a wider range of uses beyond estimating the ESD susceptibility of device level protection circuits. TLPs have been used to certify many ESD suppression devices including: device level ESD protection circuits, metal oxide varistors (MOV), Transorbs, composite voltage variable materials (VVM), diodes, spark gaps, and occasionally, even capacitors and resistors. This paper describes a simplified, yet general, TLP circuit and method called time domain transmission (TDT) mode testing. The method differs from and is compared to time domain reflection (TDR) mode measurement techniques.