基于多级冗余的一类容错VLSI/WSI系统性能建模新方法

Yung-Yuan Chen, S. Upadhyaya
{"title":"基于多级冗余的一类容错VLSI/WSI系统性能建模新方法","authors":"Yung-Yuan Chen, S. Upadhyaya","doi":"10.1109/DFTVS.1991.199957","DOIUrl":null,"url":null,"abstract":"The on-chip redundancy left unused in a fault tolerant system after successfully reconfiguring and eliminating the manufacturing defects is called residual redundancy. This redundancy can be used to improve the operational reliability of the system. The authors present a new hierarchical model to analyze the effect of residual redundancy on performance improvement of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy. Their model emphasizes the effect of support circuit (interconnection) failures on system reliability, a practical issue of great concern in WSI technology. Results of a simulation conducted to validate their model are discussed.<<ETX>>","PeriodicalId":440536,"journal":{"name":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A new approach to modeling the performance of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy\",\"authors\":\"Yung-Yuan Chen, S. Upadhyaya\",\"doi\":\"10.1109/DFTVS.1991.199957\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The on-chip redundancy left unused in a fault tolerant system after successfully reconfiguring and eliminating the manufacturing defects is called residual redundancy. This redundancy can be used to improve the operational reliability of the system. The authors present a new hierarchical model to analyze the effect of residual redundancy on performance improvement of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy. Their model emphasizes the effect of support circuit (interconnection) failures on system reliability, a practical issue of great concern in WSI technology. Results of a simulation conducted to validate their model are discussed.<<ETX>>\",\"PeriodicalId\":440536,\"journal\":{\"name\":\"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1991.199957\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1991.199957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

在一个容错系统中,在成功地重新配置并消除制造缺陷后,剩余的片上冗余被称为剩余冗余。这种冗余可以用来提高系统的运行可靠性。针对一类基于多级冗余的VLSI/WSI容错系统,提出了一种新的分层模型来分析剩余冗余对系统性能提升的影响。他们的模型强调了支持电路(互连)故障对系统可靠性的影响,这是WSI技术中非常关注的一个实际问题。讨论了验证其模型的仿真结果
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A new approach to modeling the performance of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy
The on-chip redundancy left unused in a fault tolerant system after successfully reconfiguring and eliminating the manufacturing defects is called residual redundancy. This redundancy can be used to improve the operational reliability of the system. The authors present a new hierarchical model to analyze the effect of residual redundancy on performance improvement of a class of fault tolerant VLSI/WSI systems based on multiple-level redundancy. Their model emphasizes the effect of support circuit (interconnection) failures on system reliability, a practical issue of great concern in WSI technology. Results of a simulation conducted to validate their model are discussed.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信