考虑老化误差的存储器产率和寿命估计

Dae-Hyun Kim, L. Milor
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引用次数: 7

摘要

存储器是一种高密度的设备,每比特的成本很低。更密集的内存可能包含更多的错误。为了提高存储器的成品率,需要使用良好的细胞来替换这些错误。因此,存储器的产率应考虑存储器系统所包含的修复方案来计算。在本文中,我们提出了一种方法来估计具有各种失效机制和修复方案的存储器的产量和寿命。在2Gb DDR3 SDRAM老化误差的案例研究中,我们证明了我们的产量和寿命估计与各种冗余组合的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Memory yield and lifetime estimation considering aging errors
A memory is a high-density device with low cost per bit. Denser memories are likely to contain more errors. Replacing such errors requires repair schemes with good cells for the yield enhancement of a memory. The yield of a memory, therefore, should be calculated considering the repair scheme that a memory system has incorporated. In this paper, we propose a methodology that estimates the yield and the lifetime of a memory with various failure mechanisms and repair schemes of a memory. In a case study of aging errors in a 2Gb DDR3 SDRAM, we demonstrate the feasibility of our yield and lifetime estimation with various redundancy combinations.
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