应用开关硅和封装的最新进展使设计在可测试性和可重构性方面得到改进

C. Siegl
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引用次数: 0

摘要

今天最新的混合信号设计继续在复杂性的增长,以及缩小在物理尺寸。曾经测试点可以定位在整个设计的战略点上,今天组件之间的间距和布局关注的关键性质不再支持这种方法。复杂性的增加需要电路划分以进行充分的测试。封装和工艺发展的最新进展,以及最新一代模拟开关产品中模拟特性的扩展表征,为解决这些设计问题带来了许多优势。这些理想的改进包括:宽工作电压范围,非常低的工作功率,轨对轨信号处理,宽带宽,低导通电阻,快速启用和禁用时间,以及非常小的封装尺寸。这些改进的特性通过最大限度地减少插入开关对被修改电路功能的影响,简化了设计过程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Applying Latest Advances in Switch Silicon and Packaging Enables Design Improvements in Testability and Reconfiguration
Today¿s latest mixed signal designs continue to grow in complexity as well as shrinking in physical size. Where once test-points could be located at strategic points throughout the design, today the spacing between the components and the critical nature of layout concerns no longer will support that approach. The increase in complexity requires circuit partitioning for adequate testing. Recent advances in packaging and process development, as well as extended characterization of the analog characteristics in the latest generation of analog switch products, bring many advantages to solving these design problems. These desirable improvements include: wide operating voltage range, very low power of operation, rail to rail signal handling, wide bandwidth, low on resistance, fast enable and disable times, and very small package sizes. These improved characteristics simplify the design process by minimizing the effects that inserting a switch will have in the functionality of the circuit being modified.
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