{"title":"带有秋山探针传感器的工业用原子力显微镜","authors":"S. Stucklin, M. Gullo, T. Akiyama, M. Scheidiger","doi":"10.1109/ICONN.2008.4639250","DOIUrl":null,"url":null,"abstract":"For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been integrated in a commercial AFM to significantly simplify probe exchange.","PeriodicalId":192889,"journal":{"name":"2008 International Conference on Nanoscience and Nanotechnology","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Atomic force microscopy for industry with the Akiyama-Probe sensor\",\"authors\":\"S. Stucklin, M. Gullo, T. Akiyama, M. Scheidiger\",\"doi\":\"10.1109/ICONN.2008.4639250\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been integrated in a commercial AFM to significantly simplify probe exchange.\",\"PeriodicalId\":192889,\"journal\":{\"name\":\"2008 International Conference on Nanoscience and Nanotechnology\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Nanoscience and Nanotechnology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICONN.2008.4639250\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Nanoscience and Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICONN.2008.4639250","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Atomic force microscopy for industry with the Akiyama-Probe sensor
For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been integrated in a commercial AFM to significantly simplify probe exchange.
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