基于单电子晶体管的多值逻辑的实验与仿真研究

H. Inokawa, Yasuo Takahashi
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引用次数: 23

摘要

利用单电子晶体管(set)的周期性漏极电流-栅极电压特性来构建多值逻辑(MVL)的基本元件,如通用文字门和量化器。为了弥补SET的增益小、适用电压小的缺点,提出了一种基于cmos兼容模式依赖氧化(PADOX)技术的混合SET- mosfet方案,并进行了实验验证。我们还使用SPICE电路模拟器和紧凑的解析SET模型成功地再现了结果,并估计了所提出的MVL的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental and simulation studies of single-electron-transistor-based multiple-valued logic
Periodic drain current-gate voltage characteristics of single-electron transistors (SETs) were utilized to construct basic components of multiple-valued logic (MVL), such as a universal literal gate and a quantizer. In order to supplement the small gain and the small applicable voltage of the SET, hybrid SET-MOSFET scheme is proposed and demonstrated experimentally using CMOS-compatible pattern-dependent oxidation (PADOX) technology. We also succeeded in reproducing the results using a SPICE circuit simulator with a compact analytical SET model, and estimated the performance of the proposed MVL.
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