Fengzhen Zhang, Zhaochuan Zhang, Dongping Gao, Xiaoyan Wang
{"title":"基于非均匀光栅的慢波结构相互作用阻抗和欧姆损耗表达式的验证","authors":"Fengzhen Zhang, Zhaochuan Zhang, Dongping Gao, Xiaoyan Wang","doi":"10.1109/IVEC45766.2020.9520595","DOIUrl":null,"url":null,"abstract":"The expression of the interaction impedance of the nonuniform-grating-based slow wave structure (SWS) is given in this paper. The verification of the expression of the interaction impedance and Ohmic losses of the non-dielectric-loaded (NDL) SWS and partially dielectric-loaded (PDL) SWS is verified by simulations.","PeriodicalId":170853,"journal":{"name":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The Verification of the Expression of the Interaction Impedance and Ohmic Losses of the Nonuniform-grating-based Slow Wave Structure\",\"authors\":\"Fengzhen Zhang, Zhaochuan Zhang, Dongping Gao, Xiaoyan Wang\",\"doi\":\"10.1109/IVEC45766.2020.9520595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The expression of the interaction impedance of the nonuniform-grating-based slow wave structure (SWS) is given in this paper. The verification of the expression of the interaction impedance and Ohmic losses of the non-dielectric-loaded (NDL) SWS and partially dielectric-loaded (PDL) SWS is verified by simulations.\",\"PeriodicalId\":170853,\"journal\":{\"name\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC45766.2020.9520595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC45766.2020.9520595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The Verification of the Expression of the Interaction Impedance and Ohmic Losses of the Nonuniform-grating-based Slow Wave Structure
The expression of the interaction impedance of the nonuniform-grating-based slow wave structure (SWS) is given in this paper. The verification of the expression of the interaction impedance and Ohmic losses of the non-dielectric-loaded (NDL) SWS and partially dielectric-loaded (PDL) SWS is verified by simulations.