M. White, Bing Huang, J. Qin, Z. Gur, M. Talmor, Yuan Chen, J. Heidecker, Due Nguyen, J. Bernstein
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Impact of device scaling on deep sub-micron transistor reliability - a study of reliability trends using SRAM
As microelectronics are scaled in to the deep sub-micron regime, users of advanced technology CMOS, particularly in high-reliability applications, should reassess how scaling effects impact long-term reliability. An experimental based reliability study of industrial grade SRAMs, consisting of three different technology nodes, is proposed to substantiate current acceleration models for temperature and voltage life-stress relationships. This reliability study utilizes step-stress techniques to evaluate memory technologies (0.25mum, 0.15mum, and 0.13mum) embedded in many of today's high-reliability space/aerospace applications. Two acceleration modeling approaches are presented to relate experimental FIT calculations to Mfr's qualification data
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