基于数字孪生的瞬时不确定性下的非侵入式认证

Wei Lin, Heng Chuan Tan, Bin Chen, Fan Zhang
{"title":"基于数字孪生的瞬时不确定性下的非侵入式认证","authors":"Wei Lin, Heng Chuan Tan, Bin Chen, Fan Zhang","doi":"10.1109/DSN58367.2023.00044","DOIUrl":null,"url":null,"abstract":"Programmable logic controllers (PLCs) are vulnerable to malware, which is a key security risk for Industrial Control Systems (ICSs). Existing attestation solutions are invasive because they require hardware security modules and software upgrades in legacy devices. We propose DNAttest, a Digital-twin-based Noninvasive Attestation solution to attest PLC behaviors in near-real time. DNAttest requires minimal ICS infrastructure changes and does not interfere with normal ICS operations. DNAttest detects PLC deviations by replicating all input messages for a PLC to its digital twin and comparing their output messages. Due to transient uncertainty in the PLC's internal processing state, DNAttest may output an incorrect comparison. To generate all plausible output values for comparison, we instantiate multiple emulated PLCs by replicating input messages with different timing profiles. We demonstrate on a close-to-real-world power grid testbed that DNAttest can provide a timely detection of a wide range of attacks non-invasively and accurately. DNAttest solution is lightweight and scalable. A typical desktop PC can attest more than 20 actual PLCs even if we use 10 emulators to monitor every actual PLC.","PeriodicalId":427725,"journal":{"name":"2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty\",\"authors\":\"Wei Lin, Heng Chuan Tan, Bin Chen, Fan Zhang\",\"doi\":\"10.1109/DSN58367.2023.00044\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Programmable logic controllers (PLCs) are vulnerable to malware, which is a key security risk for Industrial Control Systems (ICSs). Existing attestation solutions are invasive because they require hardware security modules and software upgrades in legacy devices. We propose DNAttest, a Digital-twin-based Noninvasive Attestation solution to attest PLC behaviors in near-real time. DNAttest requires minimal ICS infrastructure changes and does not interfere with normal ICS operations. DNAttest detects PLC deviations by replicating all input messages for a PLC to its digital twin and comparing their output messages. Due to transient uncertainty in the PLC's internal processing state, DNAttest may output an incorrect comparison. To generate all plausible output values for comparison, we instantiate multiple emulated PLCs by replicating input messages with different timing profiles. We demonstrate on a close-to-real-world power grid testbed that DNAttest can provide a timely detection of a wide range of attacks non-invasively and accurately. DNAttest solution is lightweight and scalable. A typical desktop PC can attest more than 20 actual PLCs even if we use 10 emulators to monitor every actual PLC.\",\"PeriodicalId\":427725,\"journal\":{\"name\":\"2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)\",\"volume\":\"122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSN58367.2023.00044\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN58367.2023.00044","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

可编程逻辑控制器(plc)容易受到恶意软件的攻击,这是工业控制系统(ics)的关键安全风险。现有的认证解决方案具有侵入性,因为它们需要硬件安全模块和遗留设备中的软件升级。我们提出dntestent,一个基于数字孪生的无创认证解决方案,可以近实时地验证PLC的行为。dntest只需要最少的ICS基础设施更改,并且不会干扰正常的ICS操作。dntest通过将PLC的所有输入消息复制到其数字孪生体并比较它们的输出消息来检测PLC偏差。由于PLC内部处理状态的暂态不确定性,dntest可能输出不正确的比较。为了生成所有可信的输出值进行比较,我们通过复制具有不同时序配置文件的输入消息来实例化多个仿真plc。我们在一个接近真实世界的电网测试平台上演示了dntest可以提供对各种攻击的非侵入性和准确的及时检测。dntest解决方案是轻量级和可伸缩的。即使我们使用10个模拟器来监控每个实际的PLC,一台典型的台式PC也可以测试20多个实际的PLC。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
DNAttest: Digital-twin-based Non-intrusive Attestation under Transient Uncertainty
Programmable logic controllers (PLCs) are vulnerable to malware, which is a key security risk for Industrial Control Systems (ICSs). Existing attestation solutions are invasive because they require hardware security modules and software upgrades in legacy devices. We propose DNAttest, a Digital-twin-based Noninvasive Attestation solution to attest PLC behaviors in near-real time. DNAttest requires minimal ICS infrastructure changes and does not interfere with normal ICS operations. DNAttest detects PLC deviations by replicating all input messages for a PLC to its digital twin and comparing their output messages. Due to transient uncertainty in the PLC's internal processing state, DNAttest may output an incorrect comparison. To generate all plausible output values for comparison, we instantiate multiple emulated PLCs by replicating input messages with different timing profiles. We demonstrate on a close-to-real-world power grid testbed that DNAttest can provide a timely detection of a wide range of attacks non-invasively and accurately. DNAttest solution is lightweight and scalable. A typical desktop PC can attest more than 20 actual PLCs even if we use 10 emulators to monitor every actual PLC.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信