{"title":"通过动态可重构fpga有效仿真asic中的永久故障","authors":"E. Sánchez, L. Sterpone, Anees Ullah","doi":"10.1109/FPL.2014.6927478","DOIUrl":null,"url":null,"abstract":"Hardware fault emulation for Application Specific Integrated Circuits (ASICs) on FPGAs can considerably reduce the time required for the fault simulation. This paper presents a methodology to emulate ASIC faults on state-of-the-art FPGAs. The fault emulation is achieved by following a fully automated process consisting of: constrained technology mapping of ASIC net-list; creation of fault dictionary, generation of faulty partial bit-streams and fault emulation. The proposed approach exploits run-time partial reconfiguration techniques for fault injection and avoids full net-list re-compilations. The method's feasibility is assessed through carefully selected circuits and overhead in terms of area and timing is reported.","PeriodicalId":172795,"journal":{"name":"2014 24th International Conference on Field Programmable Logic and Applications (FPL)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Effective emulation of permanent faults in ASICs through dynamically reconfigurable FPGAs\",\"authors\":\"E. Sánchez, L. Sterpone, Anees Ullah\",\"doi\":\"10.1109/FPL.2014.6927478\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Hardware fault emulation for Application Specific Integrated Circuits (ASICs) on FPGAs can considerably reduce the time required for the fault simulation. This paper presents a methodology to emulate ASIC faults on state-of-the-art FPGAs. The fault emulation is achieved by following a fully automated process consisting of: constrained technology mapping of ASIC net-list; creation of fault dictionary, generation of faulty partial bit-streams and fault emulation. The proposed approach exploits run-time partial reconfiguration techniques for fault injection and avoids full net-list re-compilations. The method's feasibility is assessed through carefully selected circuits and overhead in terms of area and timing is reported.\",\"PeriodicalId\":172795,\"journal\":{\"name\":\"2014 24th International Conference on Field Programmable Logic and Applications (FPL)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 24th International Conference on Field Programmable Logic and Applications (FPL)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FPL.2014.6927478\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 24th International Conference on Field Programmable Logic and Applications (FPL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPL.2014.6927478","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effective emulation of permanent faults in ASICs through dynamically reconfigurable FPGAs
Hardware fault emulation for Application Specific Integrated Circuits (ASICs) on FPGAs can considerably reduce the time required for the fault simulation. This paper presents a methodology to emulate ASIC faults on state-of-the-art FPGAs. The fault emulation is achieved by following a fully automated process consisting of: constrained technology mapping of ASIC net-list; creation of fault dictionary, generation of faulty partial bit-streams and fault emulation. The proposed approach exploits run-time partial reconfiguration techniques for fault injection and avoids full net-list re-compilations. The method's feasibility is assessed through carefully selected circuits and overhead in terms of area and timing is reported.