带噪声调制的宽带射频短距离定位器亚微米集成电路测试

2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI:10.1109/EDM.2016.7538725

A. A. Cherepanov, Vasiliy D. Lys

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引用次数: 2

摘要

介绍了一种测试亚微米专用集成电路的宽带射频短距离定位器。集成电路采用130纳米硅CMOS技术开发和制造。给出了测试IC元件的测量结果，包括射频振荡器10 GHz，分频器32 (10 GHz至312.5 MHz)，噪声发生器和定制射频垫。

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Test submicron integrated circuit for wideband RF short-distance locator with noise modulation

Test submicron application specific Integrated Circuit (IC) for wideband RF short-distance locator is described. IC has been developed and manufactured using 130 nm silicon CMOS technology. Results of test IC elements measurements are presented, including RF oscillator 10 GHz, frequency divider by 32 (10 GHz to 312.5 MHz), noise generator and custom RF pads.

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2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)

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