硅基多芯片模块的热管理

L. Mok
{"title":"硅基多芯片模块的热管理","authors":"L. Mok","doi":"10.1109/STHERM.1994.288993","DOIUrl":null,"url":null,"abstract":"Thermal characteristics of silicon-based multichip modules and their associated heat sinks are presented. The structure of the multichip modules allows the heat generated inside a chip to be conducted away to the heat sink through the solder balls between the chips and the silicon substrate. The internal thermal resistances thus depend on the number of solder balls as well as the number of layers of insulators on the chip and the substrate. A thermal test module which has dimensions 59/spl times/59 mm mounted with nine thermal chips has been tested. The module can dissipate about 43 W at a chip temperature rise of 60/spl deg/C when a heat sink with fin height of 25 mm is used at 1 m/s airflow. The heat sink has seven doubly folded fins which are thermally optimized to give the best cooling performance while keeping the lowest pressure drop across the heat sink at a given airflow rate.<<ETX>>","PeriodicalId":107140,"journal":{"name":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Thermal management of silicon-based multichip modules\",\"authors\":\"L. Mok\",\"doi\":\"10.1109/STHERM.1994.288993\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermal characteristics of silicon-based multichip modules and their associated heat sinks are presented. The structure of the multichip modules allows the heat generated inside a chip to be conducted away to the heat sink through the solder balls between the chips and the silicon substrate. The internal thermal resistances thus depend on the number of solder balls as well as the number of layers of insulators on the chip and the substrate. A thermal test module which has dimensions 59/spl times/59 mm mounted with nine thermal chips has been tested. The module can dissipate about 43 W at a chip temperature rise of 60/spl deg/C when a heat sink with fin height of 25 mm is used at 1 m/s airflow. The heat sink has seven doubly folded fins which are thermally optimized to give the best cooling performance while keeping the lowest pressure drop across the heat sink at a given airflow rate.<<ETX>>\",\"PeriodicalId\":107140,\"journal\":{\"name\":\"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/STHERM.1994.288993\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1994.288993","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

摘要

介绍了硅基多芯片模块及其相关散热器的热特性。多芯片模块的结构允许芯片内部产生的热量通过芯片和硅衬底之间的焊料球传导到散热器。因此,内部热阻取决于焊料球的数量以及芯片和衬底上绝缘体的层数。测试了一个尺寸为59/spl × 59 mm的热测试模块,该模块安装了9个热芯片。当散热片高度为25mm,气流速度为1m /s时,芯片温升为60/spl℃时,模块的功耗约为43w。散热器有七个双折翅片,经过热优化,可以提供最佳的冷却性能,同时在给定的气流速率下保持散热器的最低压降
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thermal management of silicon-based multichip modules
Thermal characteristics of silicon-based multichip modules and their associated heat sinks are presented. The structure of the multichip modules allows the heat generated inside a chip to be conducted away to the heat sink through the solder balls between the chips and the silicon substrate. The internal thermal resistances thus depend on the number of solder balls as well as the number of layers of insulators on the chip and the substrate. A thermal test module which has dimensions 59/spl times/59 mm mounted with nine thermal chips has been tested. The module can dissipate about 43 W at a chip temperature rise of 60/spl deg/C when a heat sink with fin height of 25 mm is used at 1 m/s airflow. The heat sink has seven doubly folded fins which are thermally optimized to give the best cooling performance while keeping the lowest pressure drop across the heat sink at a given airflow rate.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信