开发百丽SVD升级的前端电子产品

H. Aihara, M. Hazumi, H. Ishino, J. Kaneko, Y. Li, D. Marlow, S. Mikkelsen, D. Nguyen, E. Nygaard, H. Tajima, J. Talebi, G. Varner, H. Yamamoto, M. Yokoyama
{"title":"开发百丽SVD升级的前端电子产品","authors":"H. Aihara, M. Hazumi, H. Ishino, J. Kaneko, Y. Li, D. Marlow, S. Mikkelsen, D. Nguyen, E. Nygaard, H. Tajima, J. Talebi, G. Varner, H. Yamamoto, M. Yokoyama","doi":"10.1109/NSSMIC.2000.949903","DOIUrl":null,"url":null,"abstract":"Essential to the ongoing improvement in the vertexing capability of the Belle detector at the KEK-B Factory are evolutionary enhancements to the Silicon Vertex Detector (SVD). A critical component of this improvement has been the refinement of the successful Viking Architecture (VA) front-end electronics for adaptation to the high-luminosity, B-Factory environment. Specifically, improvements have focussed on the areas of improving radiation hardness and reducing the minimum shaping time. The adjustments allow for a substantially longer SVD lifetime at peak performance and the minimization of background occupancy, respectively. In addition, to increase the strip yield of our sensors, we have implemented two different techniques to allow for DC coupling of the VA chips. Results are reported on the success of this R&D program.","PeriodicalId":445100,"journal":{"name":"2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Development of front-end electronics for Belle SVD Upgrades\",\"authors\":\"H. Aihara, M. Hazumi, H. Ishino, J. Kaneko, Y. Li, D. Marlow, S. Mikkelsen, D. Nguyen, E. Nygaard, H. Tajima, J. Talebi, G. Varner, H. Yamamoto, M. Yokoyama\",\"doi\":\"10.1109/NSSMIC.2000.949903\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Essential to the ongoing improvement in the vertexing capability of the Belle detector at the KEK-B Factory are evolutionary enhancements to the Silicon Vertex Detector (SVD). A critical component of this improvement has been the refinement of the successful Viking Architecture (VA) front-end electronics for adaptation to the high-luminosity, B-Factory environment. Specifically, improvements have focussed on the areas of improving radiation hardness and reducing the minimum shaping time. The adjustments allow for a substantially longer SVD lifetime at peak performance and the minimization of background occupancy, respectively. In addition, to increase the strip yield of our sensors, we have implemented two different techniques to allow for DC coupling of the VA chips. Results are reported on the success of this R&D program.\",\"PeriodicalId\":445100,\"journal\":{\"name\":\"2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.2000.949903\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.2000.949903","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

KEK-B工厂的Belle检测器的顶点检测能力不断提高的关键是硅顶点检测器(SVD)的改进。这一改进的一个关键组成部分是维京架构(VA)前端电子设备的改进,以适应高亮度的b工厂环境。具体来说,改进集中在提高辐射硬度和减少最小成形时间方面。这些调整分别使SVD在峰值性能和最小化背景占用时的寿命大大延长。此外,为了提高传感器的条带产量,我们实施了两种不同的技术来允许VA芯片的直流耦合。报告了该研发项目的成功结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of front-end electronics for Belle SVD Upgrades
Essential to the ongoing improvement in the vertexing capability of the Belle detector at the KEK-B Factory are evolutionary enhancements to the Silicon Vertex Detector (SVD). A critical component of this improvement has been the refinement of the successful Viking Architecture (VA) front-end electronics for adaptation to the high-luminosity, B-Factory environment. Specifically, improvements have focussed on the areas of improving radiation hardness and reducing the minimum shaping time. The adjustments allow for a substantially longer SVD lifetime at peak performance and the minimization of background occupancy, respectively. In addition, to increase the strip yield of our sensors, we have implemented two different techniques to allow for DC coupling of the VA chips. Results are reported on the success of this R&D program.
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