可逆电路外观故障的检测与定位

Bappaditya Mondal, Chandan Bandyopadhyay, H. Rahaman
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引用次数: 2

摘要

本文提出了一种检测可逆电路中两种新型故障(门状故障和控制状故障)的测试方案。该测试方案既能以最少的测试向量有效地检测出指定的故障,又能同时对故障进行定位。我们开发的方法只需要一个测试向量来检测门外观故障,而发现控制外观故障则需要n个测试向量,其中n是电路中存在的输入线的数量。所提出的技术也可以适用于非常大的电路。为了验证我们开发的技术的逻辑正确性,我们已经成功地在我们提出的算法上测试了不同类型的基准电路,并在这项工作的最后给出了结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Detection and localization of appearance faults in reversible circuits
This work presents a testing scheme for detection of two new type of faults (gate appearance and control appearance fault) in reversible circuit. The testing scheme not only efficiently detects the specified faults with minimum number of test vectors but localizes it simultaneously. Our developed approach only requires a single test vector to detect gate appearance fault while to find control appearance fault it needs n test vectors, where n is the number of input lines present in the circuit. The proposed technique can also work for very large circuits as well. In way to verify logical correctness of our developed technique, we have successfully tested different types of benchmark circuits over our proposed algorithms and obtained results are given at the end of this work.
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