集成高开关频率降压变换器的电路设计考虑

M. Orabi
{"title":"集成高开关频率降压变换器的电路设计考虑","authors":"M. Orabi","doi":"10.1109/INTLEC.2009.5351833","DOIUrl":null,"url":null,"abstract":"nowadays, manufacturers of power management integrated circuits (PMICs) are producing devices that integrate many of the functional blocks required in power supplies in single tiny chips. This paper highlights the circuit design considerations as a part of highly integrated, high switching frequency (few MHz range) PMICs optimized to be fabricated using CMOS fabrication technologies. Moreover, the effect of parasitic elements associated with integration of the driver and the power MOSFET gate parasitic elements on the performance of an integrated buck converter and its effect on the switching time and loss in power MOSFETs have been investigated. Finally, a driver has been tested using spice simulations to validate the theory and then experimental results have been presented.","PeriodicalId":445164,"journal":{"name":"INTELEC 2009 - 31st International Telecommunications Energy Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Circuit design considerations for integrated high switching frequency buck converter\",\"authors\":\"M. Orabi\",\"doi\":\"10.1109/INTLEC.2009.5351833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"nowadays, manufacturers of power management integrated circuits (PMICs) are producing devices that integrate many of the functional blocks required in power supplies in single tiny chips. This paper highlights the circuit design considerations as a part of highly integrated, high switching frequency (few MHz range) PMICs optimized to be fabricated using CMOS fabrication technologies. Moreover, the effect of parasitic elements associated with integration of the driver and the power MOSFET gate parasitic elements on the performance of an integrated buck converter and its effect on the switching time and loss in power MOSFETs have been investigated. Finally, a driver has been tested using spice simulations to validate the theory and then experimental results have been presented.\",\"PeriodicalId\":445164,\"journal\":{\"name\":\"INTELEC 2009 - 31st International Telecommunications Energy Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"INTELEC 2009 - 31st International Telecommunications Energy Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INTLEC.2009.5351833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"INTELEC 2009 - 31st International Telecommunications Energy Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTLEC.2009.5351833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

如今,电源管理集成电路(pmic)的制造商正在生产将电源所需的许多功能块集成到单个微型芯片中的器件。本文强调了电路设计的考虑,作为高集成,高开关频率(少数MHz范围)的pmic的一部分,优化使用CMOS制造技术制造。此外,还研究了与驱动和功率MOSFET栅极寄生元件集成相关的寄生元件对集成降压变换器性能的影响及其对功率MOSFET开关时间和损耗的影响。最后,利用spice模拟对驱动程序进行了测试,验证了该理论,并给出了实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Circuit design considerations for integrated high switching frequency buck converter
nowadays, manufacturers of power management integrated circuits (PMICs) are producing devices that integrate many of the functional blocks required in power supplies in single tiny chips. This paper highlights the circuit design considerations as a part of highly integrated, high switching frequency (few MHz range) PMICs optimized to be fabricated using CMOS fabrication technologies. Moreover, the effect of parasitic elements associated with integration of the driver and the power MOSFET gate parasitic elements on the performance of an integrated buck converter and its effect on the switching time and loss in power MOSFETs have been investigated. Finally, a driver has been tested using spice simulations to validate the theory and then experimental results have been presented.
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