危害检测的代数

J. Brzozowski, Z. Ésik, Y. Iland
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引用次数: 31

摘要

危险脉冲是数字电路中由杂散延迟引起的不希望出现的短脉冲。这种脉冲不仅会引起电路运行误差,而且会消耗能量,增加计算时间。因此,在电路设计中检测危险是非常重要的。二值布尔代数通常用于数字电路的分析和综合,但它不能直接检测危险情况。为了克服这一限制,提出了几种多值代数用于危险检测。本文综述了这些代数,并研究了它们的数学性质。此外,本文还描述了一些最新的结果,这些结果统一了文献中提出的大多数多值代数。本文的重点仅限于门电路的静态和动态危害的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Algebras for hazard detection
Hazards pulses are undesirable short pulses caused by stray delays in digital circuits. Such pulses not only may cause errors in the circuit operation, but also consume energy, and add to the computation time. It is therefore very important to detect hazards in circuit designs. Two-valued Boolean algebra, which is commonly used for the analysis and synthesis of digital circuits, cannot detect hazard conditions directly. To overcome this limitation several multi-valued algebras have been proposed for hazard detection. This paper surveys these algebras, and studies their mathematical properties. Also, some recent results unifying most of the multi-valued algebras presented in the literature are described. Our attention in this paper is restricted to the study of static and dynamic hazards in gate circuits.
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