K. M. Kiani, Dawson B. Bonneville, A. Knights, J. Bradley
{"title":"高q因子氧化碲包覆硅微环谐振器","authors":"K. M. Kiani, Dawson B. Bonneville, A. Knights, J. Bradley","doi":"10.1109/GFP51802.2021.9673831","DOIUrl":null,"url":null,"abstract":"We present the design and experimental measurement of high-Q-factor on-chip tellurium-oxide-coated silicon microring resonators with internal Q factors of up to 1.5 × 106, corresponding to 0.4 dB/cm waveguide loss, at wavelengths around 1550 nm.","PeriodicalId":158770,"journal":{"name":"2021 IEEE 17th International Conference on Group IV Photonics (GFP)","volume":"24 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-Q-factor tellurium oxide clad silicon microring resonators\",\"authors\":\"K. M. Kiani, Dawson B. Bonneville, A. Knights, J. Bradley\",\"doi\":\"10.1109/GFP51802.2021.9673831\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present the design and experimental measurement of high-Q-factor on-chip tellurium-oxide-coated silicon microring resonators with internal Q factors of up to 1.5 × 106, corresponding to 0.4 dB/cm waveguide loss, at wavelengths around 1550 nm.\",\"PeriodicalId\":158770,\"journal\":{\"name\":\"2021 IEEE 17th International Conference on Group IV Photonics (GFP)\",\"volume\":\"24 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE 17th International Conference on Group IV Photonics (GFP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/GFP51802.2021.9673831\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 17th International Conference on Group IV Photonics (GFP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GFP51802.2021.9673831","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present the design and experimental measurement of high-Q-factor on-chip tellurium-oxide-coated silicon microring resonators with internal Q factors of up to 1.5 × 106, corresponding to 0.4 dB/cm waveguide loss, at wavelengths around 1550 nm.
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