测试超过4gbps的服务器-改变优先级

2007 IEEE Custom Integrated Circuits Conference Pub Date : 2007-09-01 DOI:10.1109/CICC.2007.4405698

S. Sunter, A. Roy

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引用次数: 1

摘要

在简要回顾了传统的抖动和抖动容差测试后，本文表明ISI是4gbps以上误码的主要来源，并且测试不足。我们展示了ISI与3.1 Gbps的过渡密度相关延迟(TDDD)之间的相关性，并提供了6.25 Gbps的欠采样数字BIST的详细硅结果，该BIST可以以皮秒分辨率测量生产速度下的抖动、TDDD和其他参数。

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Testing SerDes beyond 4 Gbps - changing priorities

After briefly reviewing conventional jitter and jitter tolerance tests for SerDes, this paper shows that ISI is a dominant source of bit errors above 4 Gbps, and is inadequately tested. We demonstrate the correlation between ISI and transition-density dependent delay (TDDD) at 3.1 Gbps, and provide detailed 6.25 Gbps silicon results for an undersampling digital BIST that can measure jitter, TDDD, and other parameters at production speeds with picosecond resolution.

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2007 IEEE Custom Integrated Circuits Conference

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