J. Reynoso‐Hernández, L. Escotte, R. Plana, J. Graffeuil
{"title":"具有扭结效应和(或)并联传导的mesfet和hemt中的微波噪声系数","authors":"J. Reynoso‐Hernández, L. Escotte, R. Plana, J. Graffeuil","doi":"10.1109/MWSYM.1992.187969","DOIUrl":null,"url":null,"abstract":"The authors consider the influence of the kink effect often noticed in MESFETs and HEMTs (high electron mobility transistors) and the parallel conduction sometimes observed in HEMTs on the microwave noise figure. It is found that the kink effect mostly affects MESFET noise and that parallel conduction affects HEMT noise, especially when operated at large drain current. Consequences for optimal bias conditions for low noise amplifiers are outlined.<<ETX>>","PeriodicalId":165665,"journal":{"name":"1992 IEEE Microwave Symposium Digest MTT-S","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Microwave noise figure in MESFETs and HEMTs with kink-effect and (or) parallel conduction\",\"authors\":\"J. Reynoso‐Hernández, L. Escotte, R. Plana, J. Graffeuil\",\"doi\":\"10.1109/MWSYM.1992.187969\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors consider the influence of the kink effect often noticed in MESFETs and HEMTs (high electron mobility transistors) and the parallel conduction sometimes observed in HEMTs on the microwave noise figure. It is found that the kink effect mostly affects MESFET noise and that parallel conduction affects HEMT noise, especially when operated at large drain current. Consequences for optimal bias conditions for low noise amplifiers are outlined.<<ETX>>\",\"PeriodicalId\":165665,\"journal\":{\"name\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 IEEE Microwave Symposium Digest MTT-S\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1992.187969\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 IEEE Microwave Symposium Digest MTT-S","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1992.187969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microwave noise figure in MESFETs and HEMTs with kink-effect and (or) parallel conduction
The authors consider the influence of the kink effect often noticed in MESFETs and HEMTs (high electron mobility transistors) and the parallel conduction sometimes observed in HEMTs on the microwave noise figure. It is found that the kink effect mostly affects MESFET noise and that parallel conduction affects HEMT noise, especially when operated at large drain current. Consequences for optimal bias conditions for low noise amplifiers are outlined.<>