利用阻抗测量预测OLED亮度

A. Haddad, A. Picot, L. Canale, G. Zissis, P. Maussion, P. Dupuis
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引用次数: 2

摘要

亮度是OLED退化的主要特征。除了使用光电二极管外,还可以利用OLED的电特性来预测亮度衰减。阻抗分析表明,亮度与阻抗时间常数之间有很强的相关性。因此,选择时间常数作为跟踪OLED退化的主要特征。使用实验设计(DoE)方法,对后者的演变进行了指数建模,以随时间在不同应力水平下进行模拟。同时,选择亮度与该时间常数之间的指数关系,实现随时间的亮度退化预测。该方法是一种精确的新颖解决方案,特别是亮度跟踪和OLED退化,总预测误差为2%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
OLED luminance prediction using impedance measurements
Luminance is the main feature to follow an OLED degradation. Beside using photo-diodes, the luminance decay can be predicted with the help of the electrical characteristics of the OLED. Analysis of the impedance revealed a strong correlation between the luminance and the impedance time constant. As a result, the time constant is chosen as the main feature to track OLED degradation. The evolution of this latter is exponentially modelled through time at different stress levels using the design of experiments (DoE) methodology. Simultaneously, an exponential relation between the luminance and this time constant is selected, enabling the luminance degradation prediction through time. This method is an accurate novel solution for luminance tracking in particular and the OLED degradation in general with a total prediction error of 2%.
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