不同厚度BiFeO3薄膜中优先畴取向对局部双极二极管电流依赖性的压电力显微镜研究

Long He, Zhihui Chen, A. Jiang
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引用次数: 0

摘要

在外延BiFeO3薄膜中观察到依赖于畴取向的局部滞后二极管电流。讨论了不同厚度薄膜中电流的双边和单边滞后以及纳米畴保留的机理。压电力显微镜研究揭示了电阻性的原理是迟滞二极管电流的可开关极化控制,而不是其他电阻性随机存取存储器中由移动带电缺陷引起的导电路径的产生和破裂。通过对不同泄漏电流模型的研究,发现空间电荷限制电流(SCLC)主导着导通。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Piezoelectric force microscopy study of local bipolar diode current dependence of preferential domain orientation in BiFeO3 thin films with different thicknesses
Local hysteretic diode currents depending on domain orientations have been observed in epitaxial BiFeO3 thin films. The mechanism behind the bilateral and unilateral current hysteresis as well as retention of the nanodomains has been discussed in the films with different thicknesses. Piezoelectric force microscopy investigations reveal principle of resistive property is the switchable polarization control of hysteretic diode currents other than the creation and rupture of the conductive paths in other resistive random access memories mediated by mobile charged defects. With the investigation of different leakage current models, it has been found that the space-charge limited current (SCLC) dominates the conduction.
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