一种用于电源噪声抑制的全集成电荷共享有源封盖方案

A. Ammar, R. Guindi, Ethan Shih, Carlos Tokunaga, J. Tschanz, M. Khellah
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引用次数: 0

摘要

随着CMOS技术的不断扩展和电源电压的不断扩展,电源噪声已成为电路正常工作的主要挑战。传统的无源去耦电容器表现出明显的晶片面积损失,导致调节效果有限。提出了一种基于全集成电荷共享的电源噪声抑制方案。所提出的想法是基于分配一部分可用的无源封装用作有源封装,该有源封装被充电到更高的电压,并在下垂检测时与噪声导轨共享其增强的电荷。该方案使用电荷泵提供高电压节点,并使用检测器电路进行下垂检测。该系统采用32nm CMOS工艺,以最小的面积和功耗代价,减少了振铃和沉降时间,实现了高达47%的最坏情况下降。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A fully integrated charge sharing active decap scheme for power supply noise suppression
Power supply noise has become a major challenge for proper operation of circuits with continuous scaling of CMOS technology along with supply voltage scaling. Conventional passive decoupling capacitors exhibit significant die area penalty resulting in a limited regulation effect. This paper presents a fully integrated charge-sharing-based active decap scheme for power supply noise suppression. The proposed idea is based on allocating a portion of the available passive decap to be used as an active decap that is charged up to a higher voltage and shares its boosted charge with the noisy rail upon droop detection. The proposed scheme uses a charge pump for providing the higher voltage node, as well as a detector circuit for droop detection. The system is implemented in 32 nm CMOS process, and achieves up to ~47% worst-case droop reduction with reduced ringing and settling time, at minimal area and power penalties.
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