{"title":"利用故障检测观测器提高模拟电路的故障检测能力","authors":"W. Vermeiren, Wolfgang Straube, G. Elst","doi":"10.1109/VTEST.1993.313321","DOIUrl":null,"url":null,"abstract":"Presents the application of fault detection observers as used in dynamic systems fault diagnosis to analog circuit testing. It will be shown that the fault detectability performance of fault detection observers is higher than those of optimal test vector generation methods which are based on maximising the differences of directly compared responses from the specification and the unit under test.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"517 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Improvement of analog circuit fault detectability using fault detection observers\",\"authors\":\"W. Vermeiren, Wolfgang Straube, G. Elst\",\"doi\":\"10.1109/VTEST.1993.313321\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents the application of fault detection observers as used in dynamic systems fault diagnosis to analog circuit testing. It will be shown that the fault detectability performance of fault detection observers is higher than those of optimal test vector generation methods which are based on maximising the differences of directly compared responses from the specification and the unit under test.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"517 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313321\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313321","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improvement of analog circuit fault detectability using fault detection observers
Presents the application of fault detection observers as used in dynamic systems fault diagnosis to analog circuit testing. It will be shown that the fault detectability performance of fault detection observers is higher than those of optimal test vector generation methods which are based on maximising the differences of directly compared responses from the specification and the unit under test.<>