{"title":"关键点检测技术","authors":"Abdelhameed S. Eltanany, M. Elwan, A. Amein","doi":"10.1007/978-3-030-31129-2_82","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":104669,"journal":{"name":"International Conference on Advanced Intelligent System and Informatics","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Key Point Detection Techniques\",\"authors\":\"Abdelhameed S. Eltanany, M. Elwan, A. Amein\",\"doi\":\"10.1007/978-3-030-31129-2_82\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":104669,\"journal\":{\"name\":\"International Conference on Advanced Intelligent System and Informatics\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Advanced Intelligent System and Informatics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-030-31129-2_82\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Advanced Intelligent System and Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-31129-2_82","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}