扫描探针显微镜图像对物体表面颗粒分析的通用算法

2017 Second Russia and Pacific Conference on Computer Technology and Applications (RPC) Pub Date : 2017-09-01 DOI:10.1109/RPC.2017.8168059

S. Balagan, E. Chusovitin, D. Goroshko, O. Goroshko

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引用次数: 7

摘要

目前，扫描探针显微镜(SPM)被广泛用于获取表面数据。大量的图像需要快速、高精度地计算表面颗粒的地形参数。原始的基于寻找局部最大值的颗粒分析算法是通过对形成SPM图像表面地形的点阵列进行排序来实现的。它提供了确定位于表面上的物体的各种地形特征(高度，横向尺寸，面积，体积等)。

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Universal algorithm for scanning probe microscopy images grain analysis of objects on the surface

Currently, scanning probe microscopy (SPM) is actively used to obtain surface data. A large number of images require a fast and high-accuracy calculation of the topographic parameters of particles on the surface. The original grain analysis algorithm based on finding a local maximum is realized by sorting an array of points forming the topography of the SPM image surface. It provides to determine various topographic characteristics of objects located on a surface (height, lateral dimensions, area, volume, etc.)

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2017 Second Russia and Pacific Conference on Computer Technology and Applications (RPC)

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