TCI测试仪:通片接口测试仪

Hideto Kayashima, H. Amano
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引用次数: 0

摘要

TCI[1]是一种感应耦合无线片对片接口。为了与TCI形成连接,发射器线圈被放置在接收器线圈的上方,数据通过磁场在它们之间传输。每个TCI通道需要两个电感,一个用于高速时钟信号(1-8GHz),另一个用于数据直接传输与时钟信号同步的数字数据,无需任何调制。TCI具有以下优点。首先,与TSV不同,电感器由CMOS工艺技术中的公共导线组成,没有特定的工艺技术。此外,ESD(静电放电)保护装置是不必要的,因为TCI是电无接触的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
TCI Tester: Tester for Through Chip Interface
TCI [1] is an inductive coupling wireless chip-to-chip interface. For forming a link with TCI, the transmitter coils are placed just above receivers’ ones, and data are transferred between them through the magnetic field. Each TCI channel needs two inductors, one for a high-speed clock signal (1-8GHz) and the other for the data directly transfer digital data synchronized with the clock signal without any modulation. TCI has the following advantages. First, the inductor consists of common wires in the CMOS process technology without the particular process technology, unlike the TSV. Also, ESD (Electro Static Discharge) protection device is unnecessary, since TCI is electrically contact-less.
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