基于广义逻辑测试覆盖函数的软件可靠性建模

Bo Zhou, H. Lei, Wen-sheng Guo
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引用次数: 1

摘要

测试覆盖是测试有效性和充分性的有效方法,对软件的可靠性和缺陷覆盖有积极的影响。测试覆盖函数描述了测试过程中测试覆盖的变化,是具有测试覆盖的软件可靠性模型的一个重要因素。本文用广义逻辑函数来表示测试覆盖率的变化。在此广义测试覆盖率函数的基础上,提出了一种新的软件可靠性增长模型和故障缺陷模型。该模型可用于软件可靠性的定量评价和预测。利用多组软件测试数据对所提模型的拟合优度进行了检验,结果较好。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Software reliability modeling with the generalized logistic test coverage function
Test coverage is a effective approach of testing effectiveness and adequacy, which has positive impact on software reliability and defect coverage. The test coverage function describes the change of test coverage during the test procedure, and it is an important factor of software reliability models with test coverage. In this paper, the change of test coverage is represented by the generalized logistic function. On the basic of this generalized test coverage function, a new software reliability growth model and a new fault defection model are proposed. The models can be used for quantitative evaluation and predict the software reliability. We test the goodness of fit of the proposed models by using several sets of software testing data and the result is better.
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