{"title":"涂膜磁线固化度的测定","authors":"George A. Walrath","doi":"10.1109/EIC.1985.7458606","DOIUrl":null,"url":null,"abstract":"In studying two different tests to determine a “common” property, several factors must be factored in. These not only include reliability of data, ease of duplication, and the other factors associated with data generation, but also include the cost per test, cost of initial equipment, and the time it takes to obtain quality results.","PeriodicalId":188957,"journal":{"name":"1985 EIC 17th Electrical/Electronics Insulation Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Deternining the cure of film coated magnet wire\",\"authors\":\"George A. Walrath\",\"doi\":\"10.1109/EIC.1985.7458606\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In studying two different tests to determine a “common” property, several factors must be factored in. These not only include reliability of data, ease of duplication, and the other factors associated with data generation, but also include the cost per test, cost of initial equipment, and the time it takes to obtain quality results.\",\"PeriodicalId\":188957,\"journal\":{\"name\":\"1985 EIC 17th Electrical/Electronics Insulation Conference\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1985 EIC 17th Electrical/Electronics Insulation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIC.1985.7458606\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1985 EIC 17th Electrical/Electronics Insulation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.1985.7458606","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In studying two different tests to determine a “common” property, several factors must be factored in. These not only include reliability of data, ease of duplication, and the other factors associated with data generation, but also include the cost per test, cost of initial equipment, and the time it takes to obtain quality results.
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