热计:表征现代和下一代处理器中高级热点的方法

Alexander Hankin, David Werner, M. Amiraski, Julien Sébot, Kaushik Vaidyanathan, Mark Hempstead
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引用次数: 6

摘要

芯片上的热热点正在成为下一代处理器设计的主要关注点之一。工业芯片设计趋势加上后邓纳德功率密度缩放导致本地化和应用相关热点的急剧增加。如果不及时处理,这些“高级”热点会导致各种不良影响,包括严重的性能损失、不正确的电路操作和缩短设备寿命。在过去,热点可以通过物理冷却系统和EDA工具来解决;然而,先进热点的严重程度对于传统的热调节技术来说是过高的。需要细粒度的体系结构级技术。为了开发这些新技术,体系结构社区需要模拟和表征高级热点的方法和度量。这项工作提出了一个新的热点表征方法为现代和下一代处理器,我们已经创造了,热计。HotGauge包含了新的方法和指标,使架构师能够构建未来的热点缓解技术。为了演示HotGauge的实用性,我们提出了一个案例研究,在这个案例研究中,我们描述了现代7nm高性能客户端CPU中的热点行为。我们观察到,在许多SPEC2006基准测试中,平均到热点时间(TUH)比其14nm的同类产品短2倍,并且我们观察到TUH在不同的基准测试中变化高达2个数量级。第一个热点仅在0.2 ms后出现。然后,我们使用HotGauge来比较不同平面图的热点严重程度,我们观察到基于平面图的热点缓解技术(如面积缩放)是不够的。为了使更广泛的社区能够进行架构级热点缓解研究,HotGauge以及本工作中案例研究中使用的所有模型都可以在https://github.com/TuftsCompArchLab/HotGaugeand https://doi.org/10.5281/zenodo.5523504上公开获取。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
HotGauge: A Methodology for Characterizing Advanced Hotspots in Modern and Next Generation Processors
On-chip thermal hotspots are becoming one of the primary design concerns for next generation processors. Industry chip design trends coupled with post-Dennard power density scaling has led to a stark increase in localized and application-dependent hotspots. These “advanced” hotspots cause a variety of adverse effects if untreated, ranging from dramatic performance loss, incorrect circuit operation, and reduced device lifespan. In the past, hotspots could be addressed with physical cooling systems and EDA tools; however, the severity of advanced hotspots is prohibitively high for conventional thermal regulation techniques alone. Fine-grained, architecture-level techniques are needed. To develop these new techniques, the architecture community needs the methods and metrics for simulating and characterizing advanced hotspots. This work presents a novel hotspot characterization methodology for modern and next generation processors which we have coined, HotGauge. HotGauge includes new methods and metrics to enable architects to build hotspot mitigation techniques of the future. To demonstrate the utility of HotGauge, we present a case study in which we characterize the hotspot behavior in a modern 7nm high-performance client CPU. We observe an average Time-until-hotspot (TUH) that is 2× shorter than in its 14nm cousin for many SPEC2006 benchmarks, and we observe TUH varies by up to 2 orders of magnitude between different benchmarks. The first hotspot arises after only 0.2 ms. We then use HotGauge to compare hotspot severity across different floorplans, and we observe that floorplanning-based hotspot mitigation techniques like area scaling are inadequate. To enable the broader community to conduct architecture-level hotspot mitigation research, HotGauge, along with all models used in the case study in this work, is publicly available at https://github.com/TuftsCompArchLab/HotGaugeand https://doi.org/10.5281/zenodo.5523504.
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