{"title":"异质结双极晶体管结温的计算","authors":"Yang-Hua Chang, Ying-Yih Wu, J.-M. Lu","doi":"10.1109/HKEDM.1999.836420","DOIUrl":null,"url":null,"abstract":"A technique to calculate junction temperature of heterojunction bipolar transistors is presented. By measurement of I/sub C/ as a function of V/sub BE/ at only a few substrate temperatures, junction temperature can be derived. Measured results are shown with a multi-finger AlGaAs/GaAs transistor.","PeriodicalId":342844,"journal":{"name":"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)","volume":"237 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Calculation of junction temperature in heterojunction bipolar transistors\",\"authors\":\"Yang-Hua Chang, Ying-Yih Wu, J.-M. Lu\",\"doi\":\"10.1109/HKEDM.1999.836420\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique to calculate junction temperature of heterojunction bipolar transistors is presented. By measurement of I/sub C/ as a function of V/sub BE/ at only a few substrate temperatures, junction temperature can be derived. Measured results are shown with a multi-finger AlGaAs/GaAs transistor.\",\"PeriodicalId\":342844,\"journal\":{\"name\":\"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)\",\"volume\":\"237 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HKEDM.1999.836420\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HKEDM.1999.836420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Calculation of junction temperature in heterojunction bipolar transistors
A technique to calculate junction temperature of heterojunction bipolar transistors is presented. By measurement of I/sub C/ as a function of V/sub BE/ at only a few substrate temperatures, junction temperature can be derived. Measured results are shown with a multi-finger AlGaAs/GaAs transistor.