{"title":"生成CMOS电路中桥接故障的测试模式","authors":"Brian Chess, T. Larrabee","doi":"10.1109/EDTC.1994.326881","DOIUrl":null,"url":null,"abstract":"We describe a system for generating accurate tests for bridge faults (with or without feedback) in CMOS ICs. We present the Test Guarantee Theorem, which allows for accurate test generation for feedback bridge faults via topological analysis of the feedback-influenced region of the faulted circuit (without the need for any post-test verification or explicit examination of inversion parity). We describe our test pattern generation system's treatment of feedback bridge faults in detail and report on the system's performance.<<ETX>>","PeriodicalId":244297,"journal":{"name":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","volume":"58 4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Generating test patterns for bridge faults in CMOS ICs\",\"authors\":\"Brian Chess, T. Larrabee\",\"doi\":\"10.1109/EDTC.1994.326881\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We describe a system for generating accurate tests for bridge faults (with or without feedback) in CMOS ICs. We present the Test Guarantee Theorem, which allows for accurate test generation for feedback bridge faults via topological analysis of the feedback-influenced region of the faulted circuit (without the need for any post-test verification or explicit examination of inversion parity). We describe our test pattern generation system's treatment of feedback bridge faults in detail and report on the system's performance.<<ETX>>\",\"PeriodicalId\":244297,\"journal\":{\"name\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"volume\":\"58 4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-02-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTC.1994.326881\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of European Design and Test Conference EDAC-ETC-EUROASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTC.1994.326881","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Generating test patterns for bridge faults in CMOS ICs
We describe a system for generating accurate tests for bridge faults (with or without feedback) in CMOS ICs. We present the Test Guarantee Theorem, which allows for accurate test generation for feedback bridge faults via topological analysis of the feedback-influenced region of the faulted circuit (without the need for any post-test verification or explicit examination of inversion parity). We describe our test pattern generation system's treatment of feedback bridge faults in detail and report on the system's performance.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
